pvdeg.letid.calc_pmp_loss_from_tau_loss#

pvdeg.letid.calc_pmp_loss_from_tau_loss(tau_0, tau_deg, cell_area, wafer_thickness, s_rear, generation=None, depth=None)[source]#

Estimate power loss from bulk lifetime loss.

Parameters:

  • tau_0 (numeric) – Initial bulk lifetime [μs]

  • tau_deg (numeric) – Degraded bulk lifetime [μs]

  • cell_area (numeric) – Cell area [cm²]

  • wafer_thickness (numeric) – Wafer thickness [μm]

  • s_rear (numeric) – Rear surface recombination velocity [cm/s]

Returns:

pmp_loss, pmp_0, pmp_deg (tuple of numeric) – Power loss [%], Initial power [W], and Degraded power [W]