pvdeg.letid.tau_now

pvdeg.letid.tau_now(tau_0, tau_deg, n_b)

Return carrier lifetime of a LID or LETID-degraded wafer given initial lifetime, fully degraded lifetime, and fraction of defects in recombination-active state B

Parameters:

• tau_0 (numeric) – Initial lifetime. Typcially in seconds, milliseconds, or microseconds.

• tau_deg (numeric) – Lifetime when wafer is fully-degraded, i.e. 100% of defects are in state B. Same units as tau_0.

• n_B (numeric) – Percentage of defects in state B [%].

Returns:

numeric – lifetime of wafer with n_B% of defects in state B. Same units as tau_0 and tau_deg.