pvdeg.letid#

Collection of functions to calculate LETID or B-O LID defect states, defect state transitions, and device degradation given device details

Function Overview#

`pvdeg.letid.calc_device_params`	Returns device parameters given a Dataframe of Jsc and Voc
`pvdeg.letid.calc_dn`	Return excess carrier concentration, i.e. "injection", given lifetime, temperature, suns-equivalent applied injection, and cell parameters.
`pvdeg.letid.calc_energy_loss`	Returns energy loss given a timeseries containing normalized changes in maximum power
`pvdeg.letid.calc_injection_outdoors`	Return "injection" of a pvlib modelchain cell/module/array operated at maximum power point.
`pvdeg.letid.calc_letid_lab`	Models LETID progression in a constant temperature and injection (i.e. lab-based accelerated test) environment.
`pvdeg.letid.calc_letid_outdoors`	Models outdoor LETID progression of a device.
`pvdeg.letid.calc_ndd`	Calculates normalized defect density given starting and ending lifetimes
`pvdeg.letid.calc_pmp_loss_from_tau_loss`	Function to estimate power loss from bulk lifetime loss
`pvdeg.letid.calc_regeneration_time`	Returns time to x% regeneration, determined by the percentage of defects in State C.
`pvdeg.letid.calc_voc_from_tau`	Return solar cell open-circuit voltage (Voc), given lifetime and other device parameters
`pvdeg.letid.carrier_factor`	Return the delta_n^x_ij term to modify attempt frequency by excess carrier density.
`pvdeg.letid.carrier_factor_wafer`	Return the delta_n^x_ij term to modify attempt frequency by excess carrier density for a passivated wafer, rather than a solar cell.
`pvdeg.letid.convert_i_to_v`	Return voltage given lifetime and applied current, and cell parameters
`pvdeg.letid.ff_green`	Calculates the empirical expression for fill factor of Si cells from open-circuit voltage.
`pvdeg.letid.j0_gray`	Returns j0 (saturation current density in quasi-neutral regions of a solar cell) as shown in eq.
`pvdeg.letid.k_ij`	Calculates an Arrhenius rate constant given attempt frequency, activation energy, and temperature
`pvdeg.letid.tau_now`	Return carrier lifetime of a LID or LETID-degraded wafer given initial lifetime, fully degraded lifetime, and fraction of defects in recombination-active state B